Juelich, Germany

Mehmet Eylem Kirlangic

This inventor holds 1 USPTO granted patent. Top assignee: Forschungszentrum Juelich Gmbh. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mehmet Eylem Kirlangic. Retrieved from https://idiyas.com/inventor/mehmet-eylem-kirlangic-vhh0a6j1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Mehmet Eylem Kirlangic: Innovator in Posturography Technology

Introduction

Mehmet Eylem Kirlangic is a notable inventor based in Juelich, Germany. He has made significant contributions to the field of posturography through his innovative methods and devices. His work focuses on enhancing the accuracy and efficiency of posturographic measurements.

Latest Patents

Kirlangic holds a patent for a "Method and device for collecting data for posturography." This invention includes a magnetizable body and an acceleration sensor located on a platform. These components are connected to a computer via an A/D converter. An electromagnet, which is displaceable in two axes parallel to the platform, is also part of the system. This setup allows for standardized posturographic measurements, enabling simultaneous detection of acceleration and platform position.

Career Highlights

Kirlangic is associated with Forschungszentrum Juelich GmbH, where he continues to develop his innovative ideas. His work has been instrumental in advancing the field of posturography, making significant strides in how data is collected and analyzed.

Collaborations

Some of his coworkers include Martina Minnerop and Christian Spross, who contribute to the collaborative environment at Forschungszentrum Juelich GmbH.

Conclusion

Mehmet Eylem Kirlangic is a pioneering inventor whose work in posturography is shaping the future of data collection in this field. His innovative methods and devices are paving the way for more accurate and standardized measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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