Chiba, Japan

Megumi Yoshimura

This inventor holds 1 USPTO granted patent. Top assignee: Tdk Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Megumi Yoshimura. Retrieved from https://idiyas.com/inventor/megumi-yoshimura-lntdv97c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Megumi Yoshimura: Innovator in Optical Recording Technology

Introduction

Megumi Yoshimura is a prominent inventor based in Chiba, Japan. She has made significant contributions to the field of optical recording technology. Her innovative work has led to the development of a patented process that enhances the efficiency and quality of optical recording mediums.

Latest Patents

Yoshimura holds a patent for an "Optical recording medium and process for producing the same." This invention represents a notable advancement in the technology used for data storage and retrieval. With 1 patent to her name, she has established herself as a key player in her field.

Career Highlights

Megumi Yoshimura is currently employed at TDK Corporation, a leading company in electronic components and recording media. Her role at TDK has allowed her to work on cutting-edge technologies that push the boundaries of optical recording.

Collaborations

Throughout her career, Yoshimura has collaborated with talented individuals such as Hiroyuki Arioka and Tsuyoshi Komaki. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Megumi Yoshimura's contributions to optical recording technology exemplify her dedication to innovation. Her work continues to influence the industry and inspire future advancements in data storage solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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