Md Imran Hossain

Title: Md Imran Hossain: Innovator in Precision Measurement Technology

Introduction

Md Imran Hossain is a notable inventor based in Plano, TX (US). He has made significant contributions to the field of precision measurement, particularly in the area of capacitor mismatch. His innovative work has led to the development of advanced circuitry and methods that enhance measurement accuracy.

Latest Patents

Md Imran Hossain holds a patent for "Precision measurement of capacitor mismatch." This invention focuses on circuitry and methods for measuring capacitive mismatch with improved precision. The capacitors under measurement are connected in series in a voltage divider, with the node common to both capacitors connected to the gate of a source follower transistor. In one embodiment, a ramped voltage is applied to the drain of the source follower transistor simultaneously with the ramped voltage applied to the voltage divider. The slope of the ramped drain voltage is aligned with the nominal slope of the voltage at the common node of the voltage divider. In another embodiment, a second transistor in saturation has its gate coupled to the source of the source follower device, and its source connected to the drain of the source follower device in series with a constant voltage drop. This configuration holds the drain-to-source voltage of the source follower device constant in each embodiment, thereby improving the precision of the measurement.

Career Highlights

Md Imran Hossain is currently employed at Texas Instruments Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of precision measurement systems.

Collaborations

He has collaborated with talented coworkers, including Andrew Marshall and Michelle N Nguyen, contributing to a dynamic and innovative work environment.

Conclusion

Md Imran Hossain's contributions to precision measurement technology exemplify the impact of innovative thinking in engineering. His patent on capacitor mismatch measurement showcases his commitment to enhancing measurement accuracy in electronic systems.