Milpitas, CA, United States of America

Mayuresh Sanjay Raut

This inventor holds 1 USPTO granted patent. Top assignee: Intuit, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mayuresh Sanjay Raut. Retrieved from https://idiyas.com/inventor/mayuresh-sanjay-raut

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mayuresh Sanjay Raut: Inventor in Mobile Application Reliability

Introduction

Mayuresh Sanjay Raut is an inventor based in Milpitas, California, and is associated with Intuit, Inc. His patent work addresses the reliability of mobile application deployments through automated monitoring and healing techniques.

Latest Patents

Raut is named on 1 patent: “Artificial Intelligence and Tracing-Enabled Automated Healing for Mobile Device Deployments.” The invention describes techniques for automatically responding to problems in a mobile application’s product flow. Metrics gathered at application flags or checkpoints are sent to a metrics server, where they can be analyzed to assess the flow’s health and identify anomalies. An auto-healer can then take actions to repair the flow or generate an alert.

Career Highlights

Raut’s listed invention focuses on applying artificial intelligence and tracing data to mobile application operations. The approach is designed to help detect issues and support automated responses during deployments.

Collaborations

Raut’s listed coworkers include Muralidhar Kattimani and Omer Muhammed. The patent describes a system involving mobile devices, a metrics server, and an auto-healer, though the available information does not specify individual contributions by collaborators.

Conclusion

Mayuresh Sanjay Raut’s patent highlights an approach to improving mobile application reliability by combining health metrics, anomaly analysis, and automated healing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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