London, United Kingdom

Mayur Shyamsunder Rao

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mayur Shyamsunder Rao. Retrieved from https://idiyas.com/inventor/mayur-shyamsunder-rao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mayur Shyamsunder Rao: Patent Work in Media Player Interface Testing.

Introduction

Mayur Shyamsunder Rao is an inventor associated with London, United Kingdom, and Amazon Technologies, Inc. His patent work addresses automated detection of user-interface defects in media player applications.

Latest Patents

Rao is associated with 1 patent: “Scalable User Interface Defect Detection in Media Player Applications via Analysis of Page Structure.” The invention describes techniques for detecting interface defects without creating a reference image. A cloud provider network receives a request to inspect a media player application, captures an image of a user interaction, identifies interface components from the image’s pixels, detects defects, and generates an output based on the findings.

Career Highlights

Rao’s listed patent reflects work at the intersection of cloud computing, image analysis, and software quality assurance. The approach aims to identify interface problems by analyzing page structure and components rather than comparing the interface with a reference image.

Collaborations

The supplied information names Noel Evans and Vijay Jagdish Joshi as Rao’s coworkers. Their specific contributions to the patent or related work are not provided.

Conclusion

Mayur Shyamsunder Rao’s patent focuses on scalable detection of defects in media player interfaces, using image-based component analysis to support software testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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