Warsaw, IN, United States of America

Mayur Deo

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Deere & Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mayur Deo. Retrieved from https://idiyas.com/inventor/mayur-deo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Innovations by Mayur Deo in Time Estimation for Machine Operations

Introduction

Mayur Deo is an accomplished inventor based in Warsaw, Indiana. He has made significant contributions to the field of machine operations through his innovative patent. His work focuses on improving efficiency and accuracy in agricultural operations.

Latest Patents

Mayur Deo holds a patent titled "Systems and methods for time estimation for machine operations." This patent describes a method that involves identifying an area of worksite for operation, assessing historical work metrics, and utilizing various models to estimate time until completion. The method incorporates multiple factors, including the number of work machines and crop types, to provide a comprehensive time estimation.

Career Highlights

Deo is currently employed at Deere & Company, a leading manufacturer in the agricultural machinery sector. His role involves applying his innovative ideas to enhance machine operations and improve productivity in the field.

Collaborations

Some of his notable coworkers include Ryan Kirk and Palash Gupta, who contribute to the collaborative environment at Deere & Company.

Conclusion

Mayur Deo's innovative approach to time estimation in machine operations showcases his commitment to advancing agricultural technology. His patent reflects a deep understanding of the complexities involved in machine operations, ultimately benefiting the industry as a whole.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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