Niwa-gun, Japan

Mayato Tanaka

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Yamazaki Mazak Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mayato Tanaka. Retrieved from https://idiyas.com/inventor/mayato-tanaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mayato Tanaka: Machine-Tool Spindle Lubrication Innovation.

Introduction

Mayato Tanaka is an inventor associated with Niwa-gun, Japan, and Yamazaki Mazak Corporation. His patent work addresses oil-containing fluid collection in machine-tool spindle lubrication systems.

Latest Patents

The provided information lists 1 patent for Tanaka: “Spindle Lubricator of Machine Tool, Machine Tool, and Use Method of Machine Tool.” The invention describes a spindle lubricator with a tool-holding rotation body, bearings, a housing, a fluid-mixture supplier, and a collector for oil-containing fluid. The collector uses separate flow channels and ejectors, with each ejector generating negative pressure to draw fluid through its channel. Flow-control valves adjust the air supplied to the ejectors, enabling control of the collection process.

Career Highlights

Tanaka’s listed patent focuses on managing oil-containing fluid in machine tools. Its design uses two independently controlled air-driven ejectors to collect fluid through separate channels.

Collaborations

The provided data names Kimihiko Sato and Takayuki Oka as Tanaka’s coworkers at Yamazaki Mazak Corporation.

Conclusion

Mayato Tanaka’s listed invention contributes a controlled, dual-channel approach to collecting oil-containing fluid in machine-tool spindle lubrication systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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