Tokyo, Japan

Mayank Bansal

This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Rakuten Group, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mayank Bansal. Retrieved from https://idiyas.com/inventor/mayank-bansal-0z8gpbcg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mayank Bansal: Innovator in Information Processing

Introduction

Mayank Bansal is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of information processing, particularly through his innovative patent. His work focuses on utilizing machine learning to enhance the analysis of satellite images.

Latest Patents

Mayank holds a patent for an "Information processing apparatus, information processing method, and non-transitory computer readable medium." This invention includes an acquisition unit that acquires satellite images, a first generation unit that predicts and generates a first image representing population distribution through machine learning, and a second generation unit that predicts land type probabilities based on the satellite image.

Career Highlights

Mayank is currently employed at Rakuten Group, Inc., where he applies his expertise in information processing. His innovative approach has positioned him as a valuable asset in the tech industry.

Collaborations

Some of his notable coworkers include Jeremiah Anderson and Vinayaraj Poliyapram. Their collaboration fosters a creative environment that enhances the development of cutting-edge technologies.

Conclusion

Mayank Bansal's contributions to information processing through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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