Kanagawa, Japan

Maya Yashima

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Canon Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maya Yashima. Retrieved from https://idiyas.com/inventor/maya-yashima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Maya Yashima: Advancing Conductive Materials at Canon

Introduction

Maya Yashima is an inventor associated with Kanagawa, Japan, and Canon Kabushiki Kaisha. Her patent work focuses on conductive materials and methods for producing conductive images.

Latest Patents

Yashima is credited with one patent: “Conductive Composition and Method of Producing Same, Method of Recording Conductive Image, and Conductive Image.” The invention describes a conductive composition containing metal particles and a compound with a specified repeating structure and molecular-weight range. The compound coats at least part of each metal particle’s surface, where its nitrogen atoms chemically bond with metal atoms. This design aims to improve particle dispersion stability and enable highly conductive images through simple post-treatment.

Career Highlights

Yashima’s listed patent reflects work on materials and processes that support the recording of conductive images. The invention brings together particle-surface chemistry, dispersion stability, and conductivity in a single composition.

Collaborations

Yashima is associated with Canon Kabushiki Kaisha. Her listed coworker is Taiki Watanabe.

Conclusion

Maya Yashima’s patent highlights an approach to producing conductive images by combining stable metal-particle dispersion with a composition designed for effective conductivity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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