Garching, Germany

Maximillian Mayr

This inventor holds 1 USPTO granted patent. Top assignee: Alkor Gmbh Kunststoffe. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maximillian Mayr. Retrieved from https://idiyas.com/inventor/maximillian-mayr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Maximillian Mayr and Plastic-Film Welding

Introduction

Maximillian Mayr is an inventor associated with Garching, Germany, and Alkor GmbH Kunststoffe. His patent work concerns a process for welding plastic films laid flat on top of one another.

Latest Patents

Mayr is credited with 1 patent, titled “Process for the Welding of Plastic Films Lying Flat One on Top of the Other.” The process brings the films into contact with a heated cutting edge, which cuts and hot-tool welds them. It can be used with two-layer or multilayer composite films made from different materials. One example pairs an opaque layer with a transparent sealing layer made from a propylene-ethylene copolymer or blend. That sealing layer is welded directly to the sealing layer of a second, transparent composite film.

Career Highlights

Mayr’s documented patent contribution focuses on joining layered plastic films through a heated cutting edge. The described method addresses composite films with differing compositions and sealing layers.

Collaborations

Mayr’s listed coworkers include Heinrich Heitz and Edgar Fleischmann. The available information identifies these professional associations but does not specify their roles in the patent.

Conclusion

Maximillian Mayr’s recorded invention presents a hot-tool welding process for joining layered plastic films, reflecting his patent work associated with Alkor GmbH Kunststoffe.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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