Sherman, CT, United States of America

Maxim Frayer



 

Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Ridgefield, CT (US) (2007)
  • Sherman, CT (US) (2018)
  • Edgewood, MD (US) (2018)

Company Filing History:


Years Active: 2007-2018

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3 patents (USPTO):

Title: Maxim Frayer: Innovator in Optical Spectroscopy

Introduction

Maxim Frayer is a notable inventor based in Sherman, CT (US). He has made significant contributions to the field of optical spectroscopy, holding a total of 3 patents. His work focuses on developing advanced spectroscopic scanning devices that enhance the capabilities of optical detection.

Latest Patents

Frayer's latest patents include a "Raster optic device for optical hyper spectral scanning." This invention describes a spectroscopic scanning device that incorporates at least one focusing element to collect light, a beam-steering element to direct the collected light, and a detector to receive the directed light. The beam-steering element is designed to successively select portions of light from various locations within its field of regard. Another significant patent is the "Dual spectrometer," which outlines systems and techniques for optical spectrometer detection. This system utilizes both IR spectroscopy components and Raman spectroscopy components to analyze samples effectively.

Career Highlights

Maxim Frayer is currently employed at Smiths Detection Inc., where he continues to innovate in the field of optical technologies. His work has been instrumental in advancing the capabilities of spectroscopic devices, making them more efficient and versatile.

Collaborations

Frayer has collaborated with notable colleagues, including Peng Zou and Terence W Sauer. These partnerships have contributed to the development of cutting-edge technologies in optical spectroscopy.

Conclusion

Maxim Frayer's contributions to optical spectroscopy through his innovative patents and collaborations highlight his role as a leading inventor in this field. His work continues to push the boundaries of what is possible in spectroscopic detection.

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