Maxim Dokukin

Title: Maxim Dokukin: Innovator in Atomic Force Microscopy

Introduction

Maxim Dokukin is a notable inventor based in Lunenburg, MA (US). He has made significant contributions to the field of atomic force microscopy, particularly through his innovative patent. His work focuses on enhancing the capabilities of atomic force microscopes, which are essential tools in various scientific research areas.

Latest Patents

Maxim Dokukin holds a patent titled "Exploitation of second-order effects in atomic force microscopy." This patent describes a processing system that collaborates with an atomic force microscope operating in ramp mode. The system is designed to collect data indicative of both physical and chemical properties of a sample. It achieves this by gathering data on probe movement at a frequency higher than the ramp frequency, allowing for the extraction of a second-order portion of the probe's signal. Based on this second-order data, the processor can determine parameters that reflect the physical and chemical properties of the sample.

Career Highlights

Maxim Dokukin is affiliated with Tufts University, where he continues to advance his research in atomic force microscopy. His work has implications for various applications, including materials science and nanotechnology. His innovative approach to data collection and analysis in atomic force microscopy has positioned him as a key figure in this field.

Collaborations

Maxim collaborates with Igor Sokolov, who is also involved in research related to atomic force microscopy. Their partnership enhances the research output and fosters innovation in their respective projects.

Conclusion

Maxim Dokukin's contributions to atomic force microscopy through his patent and research at Tufts University highlight his role as an influential inventor. His work not only advances scientific understanding but also opens new avenues for technological applications.