The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
Nov. 26, 2014
Applicant:
Tufts University, Medford, MA (US);
Inventors:
Maxim Dokukin, Lunenburg, MA (US);
Igor Sokolov, Medford, MA (US);
Assignee:
TUFTS UNIVERSITY, Arlington, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/04 (2010.01); G01Q 60/32 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/04 (2013.01); G01Q 60/32 (2013.01);
Abstract
A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample.