Turin, Italy

Mauro Di Ciommo

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mauro Di Ciommo. Retrieved from https://idiyas.com/inventor/mauro-di-ciommo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Mauro Di Ciommo

Introduction

Mauro Di Ciommo is a notable inventor based in Turin, Italy. He has made significant contributions to the field of measurement technology. His work focuses on enhancing the accuracy and reliability of coordinate measuring devices.

Latest Patents

Mauro holds a patent for a "Method of determining the measuring uncertainty of a coordinate measuring device." This innovative method involves making a real measurement of a workpiece while disabling any compensation on the machine. It utilizes the Monte Carlo method to statistically vary influence parameters affecting the measurement, ultimately determining the measuring uncertainty by analyzing deviations between simulated and measured values. Mauro has 1 patent to his name.

Career Highlights

Throughout his career, Mauro has demonstrated a commitment to advancing measurement techniques. His innovative approach has garnered attention in the industry, showcasing his expertise in statistical analysis and measurement uncertainty.

Collaborations

Mauro has worked alongside talented colleagues, including Domenico Sola and Emanuele Ricci. Their collaborative efforts have contributed to the development of cutting-edge measurement technologies.

Conclusion

Mauro Di Ciommo's contributions to the field of measurement technology highlight his innovative spirit and dedication to improving accuracy in coordinate measuring devices. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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