This inventor holds 1 USPTO granted patent. Top assignee: Thomson Hybrides Et Microondes. Active years: 1989.
Company Filing History:
Years Active: 1989
Title: The Innovative Contributions of Maurice LeCreff
Introduction
Maurice LeCreff is a notable inventor based in Garches, France. He has made significant contributions to the field of microwave technology, particularly through his innovative patent. His work has implications for measuring the characteristics of microwave components, showcasing his expertise and creativity in engineering.
Latest Patents
Maurice LeCreff holds a patent for an "Adjustable device for measuring the characteristics of a microwave." This device is designed to be fixed on a measuring instrument, providing access to the terminals of a microwave component. It allows for the measurement of scattering, noise, or output power parameters. The design minimizes the length of connections between the access lines and the input and output terminals of the component being measured. The device features two access blocks that are positionally adjustable, allowing for two degrees of freedom in relative-spacing displacement and lateral translational displacement. This innovation is applicable to various types of components, including chips, packages, and hybrid circuits.
Career Highlights
Maurice LeCreff is associated with Thomson Hybrides Et Microondes, a company that specializes in microwave technology. His work there has been instrumental in advancing measurement techniques in the field. His patent reflects his commitment to improving the accuracy and efficiency of microwave component analysis.
Collaborations
Maurice has collaborated with notable colleagues, including Bitoune Sylviane and Francois Grossier. These collaborations have likely contributed to the development and refinement of his innovative ideas.
Conclusion
Maurice LeCreff's contributions to microwave technology through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence the field, paving the way for advancements in measurement techniques.