Oulu, Finland

Matti Tervaskanto

This inventor holds 1 USPTO granted patent. Top assignee: Noptel Oy. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matti Tervaskanto. Retrieved from https://idiyas.com/inventor/matti-tervaskanto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Matti Tervaskanto: Innovator in Track Measurement Technology

Introduction

Matti Tervaskanto is a notable inventor based in Oulu, Finland. He has made significant contributions to the field of track measurement technology. His innovative approach has led to the development of a unique patent that addresses critical aspects of track alignment.

Latest Patents

Matti holds a patent for an "Arrangement and method for measuring and correcting the line of a track." This invention showcases his expertise in enhancing the accuracy and efficiency of track measurement processes. The patent reflects his commitment to advancing technology in this area.

Career Highlights

Matti is currently employed at Noptel Oy, a company known for its cutting-edge solutions in measurement technology. His role at Noptel Oy allows him to apply his inventive skills in a practical setting, contributing to the company's reputation for innovation.

Collaborations

Matti collaborates with his coworker, Raimo Ahola, who shares a similar passion for technological advancements. Their teamwork fosters a creative environment that encourages the development of new ideas and solutions.

Conclusion

Matti Tervaskanto's contributions to track measurement technology exemplify the impact of innovation in engineering. His patent and work at Noptel Oy highlight his dedication to improving measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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