San Jose, CA, United States of America

Matthieu Jeanson

This inventor holds 1 USPTO granted patent. Top assignee: Eastman-Kodak Company. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthieu Jeanson. Retrieved from https://idiyas.com/inventor/matthieu-jeanson-bnq8kyze

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Matthieu Jeanson: Inventor of an Image-Clustering Method.

Introduction

Matthieu Jeanson is an inventor associated with San Jose, California, and Eastman Kodak Company. His patent work includes a method for grouping images into events by comparing foreground and background regions.

Latest Patents

Jeanson is credited with 1 patent: “Event Clustering of Images Using Foreground/Background Segmentation.” The method divides images into blocks and segments them into foreground and background regions. It extracts features such as luminosity, color, position, and size, then compares those features across successive images. The resulting similarity measurements establish image distances that can be used to delimit clusters representing separate events.

Career Highlights

Jeanson’s listed invention addresses the challenge of organizing groups of images into similar events. By combining region segmentation with feature comparison, the method provides a structured approach to measuring similarity between successive images.

Collaborations

His listed coworkers include Alexander C. Loui and Zhaohui Sun. The patent is associated with Eastman Kodak Company.

Conclusion

Matthieu Jeanson’s patent describes an image-clustering approach that uses foreground and background segmentation to help organize photographs into event-based groups.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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