Jena, Germany

Matthias Wacker

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthias Wacker. Retrieved from https://idiyas.com/inventor/matthias-wacker-xjkmhuls

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Matthias Wacker: Innovator in Projection Imaging Technology

Introduction

Matthias Wacker is a notable inventor based in Jena, Germany. He has made significant contributions to the field of imaging technology, particularly through his innovative methods for determining optimal projection directions.

Latest Patents

Wacker holds a patent for a "Method and device for determining an optimum direction of projection for recording projection images." This invention relates to a method and device that determines the best direction of projection or position for capturing two-dimensional projection images of an object. The process involves estimating the object's position at a specific time and determining at least one optimal imaging view based on previously established measurements.

Career Highlights

Matthias Wacker is associated with Siemens Aktiengesellschaft, a leading global technology company. His work at Siemens has allowed him to develop and refine his innovative ideas in imaging technology.

Collaborations

Wacker has collaborated with notable colleagues, including Frank Deinzer and Esther-Sabrina Platzer. These collaborations have contributed to the advancement of his projects and the successful implementation of his inventions.

Conclusion

Matthias Wacker's contributions to projection imaging technology highlight his innovative spirit and dedication to advancing the field. His patent reflects a significant step forward in optimizing imaging processes, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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