Gelnhausen, Germany

Matthias Kunkel


Average Co-Inventor Count = 2.6

ph-index = 3

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2016-2018

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3 patents (USPTO):Explore Patents

Title: Matthias Kunkel: Innovator in Optical Measurement Technology

Introduction

Matthias Kunkel is a notable inventor based in Gelnhausen, Germany. He has made significant contributions to the field of optical measurement technology, holding three patents to his name. His work focuses on advancing methods for capturing surface topography, which is crucial in various industrial applications.

Latest Patents

Kunkel's latest patents include an innovative optical measuring method and a measuring device designed to capture surface topography by calibrating the orientation of the measuring head. This invention involves a measuring device equipped with a measuring head in a guide device, enabling chromatic confocal acquisition of surface topography or spectral interferometric OCT acquisition of distance to the surface. The process begins with directing spectrally broadband light from a fiber array onto the measurement object, forming a spot array of measurement spots. The device then acquires and digitizes reflection spectra from multiple measurement channels, which are evaluated to eliminate systematic measurement errors and deviations in the measuring head's movements.

Career Highlights

Kunkel is currently associated with Precitec Optronik GmbH, where he continues to develop cutting-edge optical measurement technologies. His expertise in this field has positioned him as a key player in advancing measurement techniques that enhance precision and reliability.

Collaborations

Some of Kunkel's notable coworkers include Berthold Michelt and Martin Schönleber. Their collaborative efforts contribute to the innovative environment at Precitec Optronik GmbH, fostering advancements in optical measurement solutions.

Conclusion

Matthias Kunkel's work in optical measurement technology exemplifies the impact of innovation in enhancing measurement accuracy and efficiency. His patents reflect a commitment to advancing the field, making significant strides in optical measurement methods.

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