Düsseldorf, Germany

Matthias Ciupka

This inventor holds 1 USPTO granted patent. Top assignee: Dipl.-Ing. H. Horstmann Gmbh. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthias Ciupka. Retrieved from https://idiyas.com/inventor/matthias-ciupka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Matthias Ciupka: Innovator in Optical Signaling Devices

Introduction

Matthias Ciupka is a notable inventor based in Düsseldorf, Germany. He has made significant contributions to the field of electrical monitoring devices, particularly through his innovative designs and patents. His work focuses on enhancing the functionality and reliability of signaling devices used in various applications.

Latest Patents

Matthias Ciupka holds a patent for an "Optical signaling device for electrical monitoring devices." This invention is designed to provide visual signaling for electrical monitoring devices, specifically for short circuit and ground fault indicators. The signaling device features a housing with a wall that covers the luminous element, ensuring that the device is both functional and visually perceptible. The luminous element is strategically placed on a printed circuit board within the housing, which is designed to be light-transmissive in the relevant region.

Career Highlights

Matthias Ciupka is associated with Dipl.-Ing. H. Horstmann GmbH, where he applies his expertise in developing advanced electrical monitoring solutions. His role in the company has allowed him to contribute to innovative projects that enhance safety and efficiency in electrical systems.

Conclusion

Matthias Ciupka's work in optical signaling devices exemplifies his commitment to innovation in electrical monitoring technology. His patent reflects a significant advancement in the field, showcasing his ability to create practical solutions for complex challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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