Oberscheinfeld, Germany

Matthias Baier

This inventor holds 1 USPTO granted patent. Top assignee: Dr. Ing. H.c. F. Porsche Aktiengesellschaft. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthias Baier. Retrieved from https://idiyas.com/inventor/matthias-baier-avhq3ihh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Matthias Baier: Innovator in Vehicle Component Production

Introduction

Matthias Baier is a notable inventor based in Oberscheinfeld, Germany. He has made significant contributions to the field of vehicle manufacturing, particularly through his innovative methods for producing multi-component parts.

Latest Patents

Baier holds a patent for a method for producing a multi-component part of a vehicle. This method involves inserting an air-guiding device with at least one contact portion into a cavity of a tool. The process includes heating a composite part to its melting point and simultaneously forming an integrally bonded connection between the composite part and the air-guiding device.

Career Highlights

Matthias Baier is associated with Dr. Ing. h.c. F. Porsche Aktiengesellschaft, a prestigious company known for its engineering excellence in the automotive industry. His work focuses on enhancing the efficiency and effectiveness of vehicle component production.

Collaborations

Baier collaborates with talented coworkers such as Steffen Hoelzel and Fuat Kayadere, contributing to innovative projects within the company.

Conclusion

Matthias Baier's contributions to vehicle manufacturing through his patented methods exemplify the spirit of innovation in the automotive industry. His work continues to influence the production of advanced vehicle components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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