Redmond, WA, United States of America

Matthew Wayne Keen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Arctic Wolf Networks, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Wayne Keen. Retrieved from https://idiyas.com/inventor/matthew-wayne-keen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Matthew Wayne Keen and Cybersecurity Gap Identification Using Knowledge Graphs.

Introduction

Matthew Wayne Keen is an inventor based in Redmond, Washington. His patent work addresses how organizations can identify gaps in cybersecurity prevention and detection measures.

Latest Patents

Keen is associated with 1 patent, titled “Cybersecurity Gap Identification Using Knowledge Graphs.” The invention describes a system that receives prevention data and detection data from security systems, along with a framework taxonomy connecting vulnerabilities, tactics, techniques, and sub-techniques. It maps this information into a knowledge graph, traverses the graph to iteratively identify gaps in prevention or detection measures, and returns information about those gaps.

Career Highlights

Keen is associated with Arctic Wolf Networks, Inc. His patent reflects an approach to cybersecurity analysis that uses structured relationships among threats and security measures to help reveal areas that may need attention.

Collaborations

The provided information names Kaushik Sarkar and Sylvain Huy Phong Lu as Keen’s coworkers. Their specific contributions to the patent are not stated.

Conclusion

Matthew Wayne Keen’s patent applies knowledge graphs to the practical challenge of finding gaps in cybersecurity defenses, connecting prevention and detection data with a structured framework of threats and techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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