Company Filing History:
Years Active: 1992-1996
Title: Matthew S Harcourt: Innovator in Measurement Technology
Introduction
Matthew S Harcourt is a notable inventor based in Bend, OR (US). He has made significant contributions to the field of measurement technology, holding 2 patents that showcase his innovative approach to waveform analysis and display.
Latest Patents
Harcourt's latest patents include an "Apparatus and method for displaying multiple sample spacing waveform" and an "Expansion windowing system for a measurement test instrument." The first patent describes an optical time domain reflectometer that acquires and displays waveform data as a waveform trace on a display device. This invention utilizes different pulse widths and sample spacings to enhance the visualization of waveform data. The processor calculates pixel and distance values to accurately map amplitude values to vertical pixels, producing a clear representation of the waveform trace.
The second patent focuses on a system for expanding a waveform in a measurement test instrument. It features a display area with an active movable cursor that intersects the waveform. This system includes two viewports, where the first displays the waveform and the second provides an expanded view of a portion of the waveform. The second viewport is designed to move with the cursor, allowing for continuous expansion and detailed analysis of the waveform.
Career Highlights
Matthew S Harcourt is currently employed at Tektronix, Inc., a leading company in measurement technology. His work at Tektronix has allowed him to develop innovative solutions that enhance the capabilities of measurement instruments.
Collaborations
Harcourt has collaborated with notable coworkers such as Josef L Mader and Richard I Lane. Their combined expertise has contributed to the advancement of measurement technologies and the successful development of innovative products.
Conclusion
Matthew S Harcourt is a distinguished inventor whose work in measurement technology has led to significant advancements in waveform analysis. His patents reflect a commitment to innovation and excellence in the field.