Company Filing History:
Years Active: 2015
Title: The Innovations of Matthew R Bolcar
Introduction
Matthew R Bolcar is an accomplished inventor based in Laurel, MD (US). He has made significant contributions to the field of optics, particularly in the area of wavefront sensing. His innovative work has led to the development of a unique method for measuring aberrations in optical systems.
Latest Patents
Matthew R Bolcar holds a patent for a "System and method for null-lens wavefront sensing." This patent describes a method of measuring aberrations in a null-lens, including assembly and alignment aberrations. The null-lens is utilized for measuring aberrations in aspheric optics. Light propagates from the aspheric optic location through the null-lens while sweeping a detector through the null-lens focal plane. Image data is collected at various locations around the focal plane. Light is simulated to propagate to the collection locations for each collected image. Null-lens aberrations can be extracted by applying image-based wavefront sensing to the collected images and simulation results. This innovative approach improves the accuracy of measuring aspheric optic aberrations.
Career Highlights
Matthew R Bolcar is associated with the United States of America as represented by the Administrator of NASA. His work at NASA has allowed him to engage in cutting-edge research and development in optical technologies. His contributions have been instrumental in advancing the understanding and measurement of optical aberrations.
Collaborations
Matthew has collaborated with notable colleagues, including Peter C Hill and Patrick L Thompson. These collaborations have fostered a productive environment for innovation and have led to significant advancements in their respective fields.
Conclusion
Matthew R Bolcar's contributions to the field of optics through his innovative patent and work at NASA highlight his role as a leading inventor. His advancements in wavefront sensing technology continue to influence the industry and improve optical measurement techniques.