Bartlett, IL, United States of America

Matthew Jon Kemp

This inventor holds 1 USPTO granted patent. Top assignee: Sears, Roebuck & Company. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Jon Kemp. Retrieved from https://idiyas.com/inventor/matthew-jon-kemp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2006

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Matthew Jon Kemp: Innovator in Product Search Technology

Introduction: Matthew Jon Kemp is an accomplished inventor based in Bartlett, IL (US). He has made significant contributions to the field of product search technology. His innovative approach has led to the development of a unique patent that enhances the way consumers interact with product search results.

Latest Patents: Matthew Jon Kemp holds a patent for a "Computer system and method of displaying product search results." This invention provides a method and software program for displaying product search results, as well as a computer system designed for marketing products. His work in this area has the potential to transform how products are marketed and searched for online.

Career Highlights: Matthew is currently associated with Sears, Roebuck & Company, where he applies his expertise in technology and marketing. His role at the company allows him to leverage his innovative ideas to improve customer experiences and streamline product searches.

Collaborations:

Conclusion: Matthew Jon Kemp's contributions to product search technology exemplify the impact of innovation in marketing. His patent and work at Sears, Roebuck & Company highlight his commitment to enhancing consumer interactions with products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…