Rochester, NY, United States of America

Matthew Derosa

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Navitar, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Derosa. Retrieved from https://idiyas.com/inventor/matthew-derosa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Matthew Derosa and High Numerical Aperture Imaging

Introduction

Matthew Derosa is an inventor associated with Rochester, New York, and Navitar, Inc. His patent work concerns microscope imaging, including designs that combine useful magnification with a high numerical aperture.

Latest Patents

Derosa is named on one patent, titled “High Numerical Aperture Imaging Device.” The patent describes a microscope assembly with an objective lens and an infinite conjugate tube lens. Its objective lens has an effective focal length of no more than 80 mm, while the microscope has a numerical aperture of at least 0.14 and magnification of at least 2×. Derosa’s reported portfolio includes 1 patent.

Career Highlights

Derosa’s listed company affiliation is Navitar, Inc., a company associated with optical and imaging technologies. The patent’s specifications focus on microscope performance, particularly the relationship between objective-lens focal length, numerical aperture, and magnification.

Collaborations

Michael Brindak and Yiyi Guan are identified as Derosa’s coworkers. Their shared professional context connects Derosa’s work to a broader team at Navitar, Inc.

Conclusion

Matthew Derosa’s patent on a high numerical aperture imaging device reflects his contribution to microscope design, with technical requirements aimed at combining compact optical characteristics, magnification, and imaging capability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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