Mapleton, UT, United States of America

Matthew David Osburn

This inventor holds 1 USPTO granted patent. Top assignee: Brigham Young University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew David Osburn. Retrieved from https://idiyas.com/inventor/matthew-david-osburn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Matthew David Osburn: MRI Thermometry Innovation

Introduction

Matthew David Osburn is an inventor associated with Mapleton, Utah, and Brigham Young University. His patent work addresses MRI thermometry, a technique for obtaining temperature information from magnetic resonance imaging.

Latest Patents

Osburn is named on 1 patent: “Multiple Orthogonal Slice Processing and Separation to Obtain Temperature Information for MRI Thermometry.” The invention describes decomposing baseline images for multiple orthogonal slices into image features, then acquiring a combined, multi-encoded PRF treatment image with an MRI scanner. It subtracts a weighted sum of the baseline features to isolate treatment-specific temperature information across the imaging region. The resulting information is then processed to produce temperature data specific to each slice. This approach is intended to support temperature monitoring associated with treatment or thermal ablation.

Career Highlights

Osburn’s listed affiliation is Brigham Young University. His patent reflects work on processing MRI data to distinguish treatment-related temperature changes from baseline image features.

Collaborations

Osburn’s listed coworker is Steven Paul Allen. The patent’s technical focus is the processing and separation of MRI information across multiple orthogonal slices.

Conclusion

Matthew David Osburn’s patent work at Brigham Young University focuses on extracting slice-specific temperature information from MRI data, with potential relevance to monitoring thermal treatments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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