Pointe Claire, Canada

Matthew D Odinotski

This inventor holds 1 USPTO granted patent. Top assignee: Alstom Technology Limited. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew D Odinotski. Retrieved from https://idiyas.com/inventor/matthew-d-odinotski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of Matthew D. Odinotski

Introduction

Matthew D. Odinotski is an accomplished inventor based in Pointe Claire, Canada. He is known for his innovative contributions to flame detection technology. With a focus on enhancing safety and efficiency, his work has significant implications in various industries.

Latest Patents

Matthew holds 1 patent for his invention titled "Intelligent Flame Scanner." This patent provides techniques for determining characteristics of a flame. The invention includes methods and devices that monitor a flame across a contiguous spectral range to detect emitted light. The spectral range is segmented into discrete ranges, allowing for the processing of detected light to determine at least one characteristic of the flame.

Career Highlights

Matthew is currently employed at Alstom Technology Limited, where he applies his expertise in flame detection. His work contributes to advancements in safety technologies and enhances operational efficiency in various applications.

Collaborations

Matthew collaborates with talented professionals such as Rebecca Lynn Tobiasz and Michel J. Seguin. Their combined efforts foster innovation and drive progress in their field.

Conclusion

Matthew D. Odinotski's contributions to flame detection technology exemplify the impact of innovative thinking in enhancing safety and efficiency. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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