Brownsburg, IN, United States of America

Matthew Aaron Halsmer

This inventor holds 1 USPTO granted patent. Top assignee: Beckman Coulter, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Aaron Halsmer. Retrieved from https://idiyas.com/inventor/matthew-aaron-halsmer-qc3rdu5f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Matthew Aaron Halsmer: Inventor of a Density-Gradient Replication System

Introduction

Matthew Aaron Halsmer is an inventor associated with Brownsburg, Indiana, and Beckman Coulter, Inc. His work includes a patented system designed to measure and reproduce density gradients without destroying the original gradient.

Latest Patents

Halsmer is named on 1 patent: “Non-destructive measurement, dispense, and replication of density gradients.” The invention measures a density gradient at points along its length and uses those measurements to generate a profile. It then uses that profile to replicate the gradient in a second container by pumping separate components through a manifold and mixing chamber connected to a probe.

Career Highlights

Halsmer’s patent describes an automated approach to measuring and dispensing density gradients while preserving the original sample. The system’s design may support repeatable preparation of gradients for laboratory and research applications. He is associated with Beckman Coulter, Inc.

Collaborations

Halsmer’s listed coworkers include Larry Wayne McIntyre and Steven Adam Kibler. Their names are associated with his professional context, though the provided information does not specify their roles in the patent.

Conclusion

Matthew Aaron Halsmer’s patented system combines non-destructive measurement with automated gradient replication, highlighting his contribution to laboratory technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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