Mount Prospect, IL, United States of America

Matt McGreer

This inventor holds 1 USPTO granted patent. Top assignee: Atlas Material Testing Technology Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matt McGreer. Retrieved from https://idiyas.com/inventor/matt-mcgreer-vrxysx23

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Matt McGreer and Artificial Weathering Technology.

Introduction

Matt McGreer is an inventor associated with Mount Prospect, Illinois, and Atlas Material Testing Technology GmbH. His patent work addresses equipment for artificial weathering and lightfastness testing.

Latest Patents

McGreer is credited with 1 patent. His patent, “Apparatus for Artificial Weathering Comprising Two Kinds of Light Emission Sources,” describes a weathering chamber containing two types of light sources. Fluorescent UV lamps provide emissions with a maximum wavelength below a predetermined threshold, while light-emitting diodes provide emissions above that threshold. The arrangement is designed for testing samples under artificial weathering or lightfastness conditions.

Career Highlights

McGreer’s listed invention combines fluorescent UV lamps and LEDs in a single testing apparatus. This approach brings distinct light-emission sources together within a weathering chamber for sample testing. He is associated with Atlas Material Testing Technology GmbH.

Collaborations

Jörn Jahnke and Oliver Rahäuser are identified as McGreer’s coworkers. Their shared association with Atlas Material Testing Technology GmbH provides professional context for his work.

Conclusion

Matt McGreer’s patent documents an artificial weathering apparatus that uses fluorescent UV lamps and LEDs to support lightfastness and weathering tests.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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