Matt Boubin

Title: Matt Boubin: Innovator in Non-Invasive Diagnostic Systems

Introduction

Matt Boubin is an accomplished inventor based in Queens, NY (US). He has made significant contributions to the field of non-invasive diagnostic systems, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

Boubin's latest patents focus on non-invasive diagnostic systems and methods for measuring electromagnetic interference (EMI). One of his notable inventions involves a method to noninvasively identify component degradation or failure in power electronics circuitry. This method characterizes the degradation or failure characteristics of the component and models those characteristics to enable a machine learning algorithm to identify EMI frequency distribution characteristics that correspond to the degradation or failure. The EMI frequency distribution is measured, and the data is provided to the machine learning algorithm, which identifies degradation or failures indicated by the measured data.

Career Highlights

Matt Boubin is currently associated with Miami University, where he continues to advance his research and development in the field of diagnostics. His work has garnered attention for its potential applications in various industries, particularly in enhancing the reliability of electronic systems.

Collaborations

Boubin collaborates with Mark Scott, a fellow innovator, to further explore advancements in their field. Their partnership aims to push the boundaries of technology and improve diagnostic methods.

Conclusion

Matt Boubin's contributions to non-invasive diagnostic systems reflect his commitment to innovation and technology. His work not only enhances the understanding of electronic component failures but also paves the way for future advancements in the field.