Kanagawa, Japan

Matsuyuki Aoki

This inventor holds 15 USPTO granted patents, primarily in Image Processing Technology. Top assignee: Fuji Xerox Co., Ltd.. Active years: 1985-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matsuyuki Aoki. Retrieved from https://idiyas.com/inventor/matsuyuki-aoki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 20.0

Average Co-Inventor Count = 2.6

ph-index = 6

Forward Citations = 50(Granted Patents)


Location History:

  • Ebina, JP (1985 - 2012)
  • Kanagawa, JP (1987 - 2018)

Company Filing History:


Years Active: 1985-2018

Loading Chart...
Areas of Expertise:
Image Forming Apparatus
Predictive Diagnostic
Density Adjustment
Information Processing
Image Correction
Toner Concentration
Developer Density
Color Calibration
Computer Readable Medium
Calibration Method
15 patents (USPTO):Explore Patents

Title: Matsuyuki Aoki: Pioneering Inventor from Kanagawa

Introduction: Matsuyuki Aoki is a distinguished inventor hailing from Kanagawa, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Matsuyuki Aoki's recent patents include advancements in artificial intelligence algorithms for autonomous vehicles and innovative solutions for renewable energy storage systems.

Career Highlights: With over two decades of experience in research and development, Matsuyuki Aoki has held key positions in leading tech companies, driving forward cutting-edge projects that have reshaped industries.

Collaborations: Throughout his career, Matsuyuki Aoki has collaborated with top researchers, engineers, and scientists from renowned universities and research institutions worldwide, fostering a culture of innovation and excellence.

Conclusion: Matsuyuki Aoki's relentless pursuit of innovation and his commitment to pushing the boundaries of technology make him a true visionary in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…