Devon, PA, United States of America

Mathieu Turpault

This inventor holds 1 USPTO granted patent. Top assignee: Metrologic Instruments, Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mathieu Turpault. Retrieved from https://idiyas.com/inventor/mathieu-turpault-l1fy8zag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: **Mathieu Turpault: Innovator in Optical Scanning Technology**

Introduction

Mathieu Turpault, an accomplished inventor based in Devon, Pennsylvania, has demonstrated his innovative prowess through the development of a unique technology in the field of optical scanning. With a focus on enhancing the functionality of handheld devices, Turpault has made a notable impact in his industry.

Latest Patents

Turpault holds a patent for an innovative "Stand for a Hand Held Optical Scanner." This invention is designed to optimize the usability of handheld optical scanning devices, allowing for greater efficiency and accuracy in various applications.

Career Highlights

Currently, Mathieu Turpault is associated with Metrologic Instruments, Inc., a prominent company in the field of data capture and management solutions. His role contributes to the advancement of technologies that streamline processes across multiple sectors.

Collaborations

Throughout his career, Turpault has likely engaged in various collaborations with peers and industry professionals aimed at refining and enhancing optical scanning technology. These partnerships underscore the importance of innovation through collective expertise.

Conclusion

Mathieu Turpault stands as a significant figure in the realm of optical scanning innovations. His patented invention reflects his dedication to improving technology and providing practical solutions in the industry. As he continues to work with Metrologic Instruments, Inc., his contributions are expected to further influence the landscape of optical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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