Shepshed, United Kingdom

Mathew Ayres

This inventor holds 1 USPTO granted patent. Top assignee: Campbell Scientific, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mathew Ayres. Retrieved from https://idiyas.com/inventor/mathew-ayres

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mathew Ayres and Photovoltaic Soiling Monitoring

Introduction

Mathew Ayres is an inventor based in Shepshed, Great Britain. His patent work addresses monitoring soiling on monofacial and bifacial photovoltaic panels, helping assess how accumulated dirt affects solar-module output.

Latest Patents

Ayres is associated with 1 patent, titled “Sensors and Methods for Monitoring Soiling on Monofacial and Bifacial Photovoltaic Panels.” The invention describes systems and methods for monitoring soiling on photovoltaic modules using a sensor with a measure chamber and a clean chamber. Cells in the measure chamber provide readings affected by soiling, while reference cells exposed to incident light outside the clean chamber help establish a clean-output measurement. Comparing these readings makes it possible to determine soiling-related power loss.

Career Highlights

Ayres is associated with Campbell Scientific, Inc. His patent focuses on a practical measurement approach for evaluating soiling losses in photovoltaic systems.

Collaborations

The provided information identifies Ajay Singh and James Richards as Ayres’s coworkers. Their shared professional context connects them with work at Campbell Scientific, Inc.

Conclusion

Mathew Ayres’s patent contributes a sensor-based method for distinguishing clean photovoltaic output from output affected by soiling, supporting the assessment of solar-panel performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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