Landshut, Germany

Matej Ozim

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Autoscan Gmbh. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matej Ozim. Retrieved from https://idiyas.com/inventor/matej-ozim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


 

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations by Matej Ozim in Vehicle Damage Detection

Introduction

Matej Ozim is an innovative inventor based in Landshut, Germany. He has made significant contributions to the field of vehicle damage detection through his inventive solutions. His work focuses on enhancing the accuracy and efficiency of identifying damages on vehicle bodies.

Latest Patents

Matej Ozim holds a patent for a "Mobile and automated apparatus for the detection and classification of damages on the body of a vehicle." This invention addresses the need for a reliable method to detect dents and depressions caused by external objects, such as hailstones. The apparatus features a support structure that includes lighting means to project a grid pattern on the vehicle's surfaces, speed and distance sensors, and image recording capabilities. This technology allows for the automated detection, counting, classification, and recording of damages on vehicle bodies.

Career Highlights

Matej Ozim is associated with Autoscan GmbH, where he applies his expertise in developing advanced vehicle inspection technologies. His role at the company emphasizes the importance of innovation in the automotive industry, particularly in damage assessment.

Conclusion

Matej Ozim's contributions to vehicle damage detection through his patented technology exemplify the impact of innovation in the automotive sector. His work not only enhances the efficiency of damage assessment but also sets a standard for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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