Tokyo, Japan

Masuo Okumura

This inventor holds 1 USPTO granted patent. Top assignee: Olympus Optical Company, Ltd.. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masuo Okumura. Retrieved from https://idiyas.com/inventor/masuo-okumura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Masuo Okumura: Innovator in Data Recording Technology

Introduction

Masuo Okumura is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of data recording technology. His innovative approach has led to the development of a unique method and apparatus that enhances data storage capabilities.

Latest Patents

Masuo Okumura holds a patent for a "Data recording area signal generating method and apparatus." This invention relates to a method and an apparatus for generating a data recording area signal. It is designed to define an appointed data recording area on a data storing medium that has a multitude of sectors with high information density recorded by means of beam irradiation. The index signal derived from the detected index pattern in a sector is used together with a clock signal supplied.

Career Highlights

Okumura is associated with Olympus Optical Company, Ltd., where he has been able to apply his expertise in optical technologies. His work has contributed to advancements in data storage solutions, making them more efficient and reliable.

Collaborations

One of his notable coworkers is Ken Ohshima, with whom he has likely collaborated on various projects within the company.

Conclusion

Masuo Okumura's contributions to data recording technology exemplify the innovative spirit of modern inventors. His work continues to influence the field and improve data storage methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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