Seriate, Italy

Massimiliano Pesenti

This inventor holds 1 USPTO granted patent. Top assignee: Clay Paky S.r.l.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Massimiliano Pesenti. Retrieved from https://idiyas.com/inventor/massimiliano-pesenti

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Massimiliano Pesenti and Photometric Calibration for Lighting Devices.

Introduction

Massimiliano Pesenti is an inventor associated with Seriate, Italy, and Clay Paky S.r.l. His work includes an invention for detecting and processing photometric parameters of lighting devices.

Latest Patents

Pesenti is associated with 1 patent: “Method for Detecting and Processing Photometric Parameters of Lighting Devices, and Corresponding Computer Program Product and Controller.”

The invention describes a method for obtaining photometric calibration data from a lighting device with multiple electrically powered light sources. A photometric sensor first measures background light while the device is off, then records light-emission signals while it is on. The system processes those signals using the background measurement to produce clean emission signals, from which calibration data are generated. These data can be used to recalibrate the measured device or adjust the emission parameters of other, cloned devices.

Career Highlights

Pesenti’s listed patent connects his work with lighting technology and photometric calibration. The method addresses how background illumination can be accounted for when measuring a device’s light output.

Collaborations

Pesenti is associated with Clay Paky S.r.l. His listed coworker is Xiaolong Li.

Conclusion

Massimiliano Pesenti’s patent describes a practical approach to measuring and calibrating lighting devices, with calibration data that can also be applied to cloned devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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