Location History:
- Tokorozawa, JP (2008 - 2013)
- Hitachinaka, JP (2012 - 2013)
Company Filing History:
Years Active: 2008-2013
Title: Masayuki Hachiya: Innovator in Optical Inspection Technologies
Introduction
Masayuki Hachiya is a prominent inventor based in Tokorozawa, Japan. He has made significant contributions to the field of optical inspection technologies, holding a total of 9 patents. His work focuses on developing advanced inspection apparatuses and methods that enhance the efficiency and accuracy of optical defect detection.
Latest Patents
Hachiya's latest patents include an innovative inspection apparatus and method. One of his notable inventions is an object mounting mechanism that features a plate member designed for optimal object placement. This mechanism incorporates bumps arranged in a specific pattern, with sparse distribution around the edges and a denser arrangement toward the center, ensuring effective support for the mounted object. Another significant patent is an optical defect inspection apparatus that utilizes a laser beam. This apparatus employs first and second plane mirrors to fold the laser beam's path, directing it into a beam expander. To maintain the reflectance of the mirrors and prolong their useful life, Hachiya's design includes a mechanism that rotates or translates the reflecting surfaces while keeping the optical axis unchanged.
Career Highlights
Hachiya is currently associated with Hitachi High-Technologies Corporation, where he continues to innovate in the field of optical inspection. His work has been instrumental in advancing technologies that are crucial for quality control in various industries.
Collaborations
Throughout his career, Hachiya has collaborated with notable colleagues, including Kazuhiro Zama and Shigeru Matsui. These collaborations have contributed to the development of cutting-edge technologies in optical inspection.
Conclusion
Masayuki Hachiya's contributions to optical inspection technologies have established him as a key figure in the field. His innovative patents and ongoing work at Hitachi High-Technologies Corporation continue to influence advancements in quality control and defect detection.