Tokyo, Japan

Masatugu Ogawa

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masatugu Ogawa. Retrieved from https://idiyas.com/inventor/masatugu-ogawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Masatugu Ogawa: Inventor in Information Recording Technology

Introduction

Masatugu Ogawa is an inventor associated with Tokyo, Japan, and NEC Corporation. His patent work concerns methods and equipment for recording and playing back information on recording media.

Latest Patents

The supplied information identifies one patent associated with Ogawa: Information Recording Medium Recording Method, Information Recording/Playback Apparatus, and Information Recording Medium. The invention describes interrupting recording when a specified condition is met, then playing back recorded data to obtain a waveform signal. Error information is determined by comparing that signal with a reference waveform derived through partial-response equalization, and the recording conditions are adjusted based on the error information. The patent also covers a recording/playback apparatus and an information recording medium. Ogawa is credited with 1 patent in the data provided.

Career Highlights

Ogawa’s listed work connects him with NEC Corporation and focuses on improving recording accuracy through playback-based error evaluation and correction of recording conditions.

Collaborations

The supplied information names Masaki Nakano and Hideo Sano as Ogawa’s coworkers. Their specific contributions to the patent are not detailed in the information provided.

Conclusion

Masatugu Ogawa’s documented patent work addresses reliable information recording by using playback signals and error information to refine recording conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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