This inventor holds 1 USPTO granted patent. Top assignee: Sumitomo Metal Industries, Inc.. Active years: 1981.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1981
Title: Masatoshi Tomabechi: Innovator in Ultrasonic Flaw Detection
Introduction
Masatoshi Tomabechi is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of ultrasonic flaw detection, particularly in the context of pipe welding zones. His innovative approach has enhanced the efficiency and accuracy of flaw detection processes.
Latest Patents
Tomabechi holds a patent for a "Method and apparatus for the automatic ultrasonic flaw detection." This invention focuses on the automatic detection of flaws in pipe welding zones by dividing the width of the weld zone into multiple subdivisions. The ultrasonic energy received from each subdivision is displayed using multichannel gate circuitry, which provides outputs in units of 10% of the height of the echoes. This data is synchronized with signals that represent the position of the probes along the pipe. The results are displayed on a cathode ray tube, allowing for high-speed data processing and a significant reduction in the time required for precise flaw detection compared to traditional manual methods.
Career Highlights
Masatoshi Tomabechi is associated with Sumitomo Metal Industries, Inc., where he has applied his expertise in ultrasonic technology. His work has been instrumental in advancing the methods used for flaw detection in industrial applications.
Collaborations
Throughout his career, Tomabechi has collaborated with notable colleagues, including Toshio Shiraiwa and Hisao Yamaguchi. These partnerships have contributed to the development and refinement of his innovative technologies.
Conclusion
Masatoshi Tomabechi's contributions to ultrasonic flaw detection represent a significant advancement in the field. His patented methods have improved the efficiency and accuracy of flaw detection processes, showcasing his impact as an inventor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile