Amagasaki, Japan

Masatomi Okumura

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masatomi Okumura. Retrieved from https://idiyas.com/inventor/masatomi-okumura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Masatomi Okumura: Innovator in Infrared Detection Technology

Introduction

Masatomi Okumura is a notable inventor based in Amagasaki, Japan. He has made significant contributions to the field of infrared detection technology. His work has led to advancements that are crucial for various applications in modern technology.

Latest Patents

Masatomi Okumura holds a patent for an "Infrared detection element array and method for fabricating the same." This innovation showcases his expertise in developing advanced detection systems that enhance the capabilities of infrared technology. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Okumura is associated with Mitsubishi Electric Corporation, a leading company in the electronics industry. His role at the company has allowed him to work on cutting-edge technologies and contribute to the development of new products that leverage infrared detection.

Collaborations

Throughout his career, Masatomi Okumura has collaborated with talented individuals such as Yuichi Sakai and Hisao Watarai. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Masatomi Okumura's contributions to infrared detection technology exemplify the impact of dedicated inventors in advancing modern technology. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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