Tokyo, Japan

Masato Kuroki

This inventor holds 1 USPTO granted patent. Top assignee: Shibaura Institute of Technology. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masato Kuroki. Retrieved from https://idiyas.com/inventor/masato-kuroki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations by Masato Kuroki

Introduction

Masato Kuroki is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of image processing technology. His work focuses on creating high-quality images from arbitrary viewpoints, which has important applications in various industries.

Latest Patents

Kuroki holds a patent for an "Other viewpoint closed surface image pixel value correction device, method of correcting other viewpoint closed surface image pixel value, user position information output device, method of outputting user position information." This technology enables the creation of an arbitrary viewpoint image with high quality based on pixel value information as seen from a single viewpoint and real spatial positional information. The method involves extracting hidden points based on relative positional relationships and correcting pixel values accordingly. He has 1 patent to his name.

Career Highlights

Masato Kuroki is affiliated with the Shibaura Institute of Technology, where he continues to advance his research and development efforts. His innovative approach to image processing has garnered attention in academic and professional circles.

Collaborations

Kuroki collaborates with Masafumi Nakagawa, contributing to the advancement of their shared research interests.

Conclusion

Masato Kuroki's work exemplifies the intersection of technology and innovation in image processing. His contributions are paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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