Kawasaki, Japan

Masataka Suga


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2024-2025

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2 patents (USPTO):Explore Patents

Title: Masataka Suga: Innovator in Charged-Particle Measurement Technology

Introduction

Masataka Suga is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of charged-particle measurement technology. With a total of 2 patents, Suga's work focuses on innovative methods and apparatuses for measuring charged particles.

Latest Patents

Suga's latest patents include a "Charged-particle measurement apparatus and control method of charged-particle measurement apparatus." This invention features a plurality of gas detectors that detect the passage of charged particles. It includes a trajectory calculator that computes the trajectory of the charged particle based on detection signals. Additionally, it has a measurer for measuring an object based on the particle's trajectory and an operating state monitor that evaluates the gas detectors' performance. Another notable patent is the "Charged-particle trajectory measurement apparatus and charged-particle trajectory measurement method." This apparatus is designed to measure the trajectory of cosmic ray muons and integrates a signal processing circuit with detectors to enhance measurement accuracy.

Career Highlights

Throughout his career, Masataka Suga has worked with notable companies such as Toshiba Corporation and Toshiba Energy Systems & Solutions Corporation. His experience in these organizations has allowed him to develop and refine his innovative technologies in charged-particle measurement.

Collaborations

Suga has collaborated with esteemed colleagues, including Naoto Kume and Haruo Miyadera. Their joint efforts have contributed to advancements in the field of particle measurement.

Conclusion

Masataka Suga's contributions to charged-particle measurement technology highlight his innovative spirit and dedication to advancing scientific understanding. His patents reflect a commitment to improving measurement techniques, which can have significant implications in various scientific fields.

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