Yokohama, Japan

Masasi Ookubo

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masasi Ookubo. Retrieved from https://idiyas.com/inventor/masasi-ookubo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 39(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovations of Masasi Ookubo

Introduction

Masasi Ookubo is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of semiconductor technology. His work focuses on improving the testing apparatus for semiconductor devices, which is crucial for the advancement of electronic components.

Latest Patents

Masasi Ookubo holds a patent for an "Apparatus for testing semiconductor device." This innovative apparatus features a plurality of probes and coaxial cables for impedance matching. Additionally, it includes springs that provide flexibility to the individual probes, allowing them to absorb level differences in the surface of a semiconductor device. This design enables effective testing of semiconductor devices with high-density electrode arrangements. He has 1 patent to his name.

Career Highlights

Masasi Ookubo is associated with Hitachi, Ltd., a leading company in technology and electronics. His work at Hitachi has allowed him to contribute to various advancements in semiconductor testing. His expertise in this area has positioned him as a valuable asset to the company.

Collaborations

Masasi Ookubo has collaborated with notable colleagues, including Susumu Kasukabe and Yutaka Akiba. These collaborations have fostered innovation and development in their respective fields.

Conclusion

Masasi Ookubo's contributions to semiconductor testing technology highlight his role as an influential inventor. His innovative apparatus has the potential to enhance the efficiency of semiconductor device testing. His work continues to impact the electronics industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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