Kanagawa, Japan

Masashi Ogino

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Amada Company, Limited. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masashi Ogino. Retrieved from https://idiyas.com/inventor/masashi-ogino

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Masashi Ogino: Innovator in Tool Management Technology

Introduction

Masashi Ogino is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of tool management technology. His innovative approach focuses on enhancing the efficiency and accuracy of tool wear measurement.

Latest Patents

Masashi Ogino holds a patent for a "Tool management device and tool management method for determining an accumulated wear amount of a tool." This invention features an accumulated wear amount calculation section that calculates the wear amounts of the blade edges of both a punch and a die after processing sheet metal. The device accumulates these wear amounts over multiple processing cycles, allowing for precise management of tool conditions.

Career Highlights

Ogino is currently employed at Amada Company, Limited, a leading manufacturer in the metalworking industry. His work at Amada has allowed him to apply his innovative ideas in practical settings, contributing to advancements in tool management systems.

Collaborations

Masashi Ogino collaborates with Tetsuya Sano, a fellow innovator in the field. Their partnership enhances the development of new technologies and solutions within their company.

Conclusion

Masashi Ogino's contributions to tool management technology exemplify the importance of innovation in manufacturing processes. His patent reflects a commitment to improving efficiency and accuracy in tool wear measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…