Ibaraki, Japan

Masao Uchida

This inventor holds 1 USPTO granted patent. Top assignee: Teijin Limited. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masao Uchida. Retrieved from https://idiyas.com/inventor/masao-uchida-l879gloo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Masao Uchida: High-Temperature Surface Treatment Innovation.

Introduction

Masao Uchida is an inventor associated with Ibaraki, Japan, and Teijin Limited. His patent work addresses the treatment of metallic and ceramic surfaces at high temperatures.

Latest Patents

Uchida is credited with 1 patent: “Method for Treating Metallic or Ceramic Surfaces at High Temperatures.” The invention describes treating surfaces such as hot plates and metallic molds at temperatures of 200°C or above while reducing the formation of tar or sludge from organic treating agents. The method is intended to help prevent surface staining and avoid machine stoppages for heater cleaning, supporting continuous operation. Suggested treating agents include certain heat-decomposable polyalkylene glycols and fluorine-containing compounds, preferably of the nonionic type.

Career Highlights

Uchida’s listed patent highlights an industrial approach to maintaining clean metallic and ceramic surfaces during high-temperature processing. The method focuses on reducing residue and interruptions associated with organic surface-treatment agents.

Collaborations

Uchida’s listed coworkers include Hiroyuki Moriga and Koichi Iwashita. His company affiliation is Teijin Limited.

Conclusion

Masao Uchida’s patent presents a practical surface-treatment method designed to reduce residue and support continuous high-temperature industrial operation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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