Gotemba, Japan

Masao Tohyama


Average Co-Inventor Count = 1.9

ph-index = 4

Forward Citations = 41(Granted Patents)


Location History:

  • Gotenba, JP (1994)
  • Gotemba, JP (1997 - 2000)

Company Filing History:


Years Active: 1994-2000

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5 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Masao Tohyama

Introduction

Masao Tohyama is a notable inventor based in Gotemba, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the design of socket apparatus for integrated circuits (ICs). With a total of 5 patents to his name, Tohyama's work has had a lasting impact on the industry.

Latest Patents

One of Tohyama's latest patents is a socket apparatus designed for burn-in tests of IC packages. This innovative socket employs rack and pinion gears to drive contact makers, ensuring precise positioning of IC packages during testing. The design includes a slide actuator member that raises and lowers contact makers, allowing for efficient engagement with the IC terminals. Another notable patent involves an IC seating portion of a socket that prevents entanglement of IC terminal leads with contact pins, enhancing the reliability of semiconductor devices.

Career Highlights

Tohyama has spent a significant portion of his career at Texas Instruments Corporation, where he has been instrumental in developing advanced socket technologies. His expertise in semiconductor design has positioned him as a key figure in the field, contributing to the company's reputation for innovation.

Collaborations

Throughout his career, Tohyama has collaborated with talented individuals such as Kiyokazu Ikeya and Kiyoshi Adachi. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies in the semiconductor industry.

Conclusion

Masao Tohyama's contributions to the field of semiconductor technology through his innovative socket designs have significantly advanced the industry. His work continues to influence the development of reliable and efficient testing methods for integrated circuits.

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