Yukuhashi, Japan

Masao Ikeguchi

This inventor holds 1 USPTO granted patent. Top assignees: Hamada Printing Press Co., Ltd., Kabushiki Kaisha Yaskawa Denki Seisakusho. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masao Ikeguchi. Retrieved from https://idiyas.com/inventor/masao-ikeguchi-0apfnbm0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovations of Masao Ikeguchi

Introduction

Masao Ikeguchi is a notable inventor hailing from Yukuhashi, Japan. He has made significant contributions to the field of printing technology, particularly through his innovative patent. His work reflects a deep understanding of engineering principles and a commitment to advancing industry standards.

Latest Patents

Masao Ikeguchi holds a patent for a "Method and system for synchronously phase-controlling printing roll." This invention showcases his expertise in optimizing printing processes, which is crucial for enhancing efficiency and quality in the printing industry. The patent highlights his ability to address complex challenges in technology.

Career Highlights

Throughout his career, Ikeguchi has worked with prominent companies, including Kabushiki Kaisha Yaskawa Denki Seisakusho and Hamada Printing Press Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to various projects that push the boundaries of printing technology.

Collaborations

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Conclusion

Masao Ikeguchi's contributions to the field of printing technology through his innovative patent and career experiences demonstrate his significant impact on the industry. His work continues to inspire future advancements in printing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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