This inventor holds 1 USPTO granted patent. Top assignees: Nsk-Warner K.k., Tokyo University of Agriculture and Technology. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2013
Title: Masao Eguchi: Innovator in Contact Area Measurement Technology
Introduction
Masao Eguchi is a notable inventor based in Fuchu, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to contact area measurement. His work has implications in various scientific and industrial applications.
Latest Patents
Masao Eguchi holds a patent for a "Contact area measurement device and method for measuring contact area." This novel apparatus includes a light transmissive substrate that comes into contact with a specimen. It utilizes illumination means to shine white light through the substrate, allowing for the acquisition of interference images. The device computes contact area by analyzing intensity histograms derived from the interference images, employing advanced statistical methods to separate intensity data into normal distributions.
Career Highlights
Throughout his career, Masao Eguchi has worked with prestigious institutions, including the Tokyo University of Agriculture and Technology and NSK-Warner K.K. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge research in measurement technologies.
Collaborations
Masao Eguchi has collaborated with notable colleagues such as Takashi Shibamiya and Manabu Sawayanagi. These partnerships have fostered innovation and have been instrumental in advancing the field of contact area measurement.
Conclusion
Masao Eguchi's contributions to measurement technology, particularly through his patented device, highlight his role as an influential inventor. His work continues to impact various industries, showcasing the importance of innovation in scientific advancement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile