Kawasaki, Japan

Masaki Yamabe

This inventor holds 5 USPTO granted patents. Top assignee: Fujitsu Corporation. Active years: 1988-1996.


% Patents Active = 100.0

Average Co-Inventor Count = 3.2

ph-index = 5

Forward Citations = 260(Granted Patents)


Location History:

  • Tokyo, JP (1988)
  • Kawasaki, JP (1995 - 1996)

Company Filing History:


Years Active: 1988-1996

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5 patents (USPTO):Explore Patents

Title: Masaki Yamabe: Innovator in Electron Beam Technology

Introduction

Masaki Yamabe is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of electron beam technology, holding a total of 5 patents. His work primarily focuses on pattern inspection apparatuses, which are essential in the semiconductor industry.

Latest Patents

Yamabe's latest patents include innovative designs for pattern inspection apparatuses and electron beam apparatuses. These devices are engineered to perform quick and accurate inspections of samples such as masks and wafers. The technology involves irradiating electron beams onto the inspection sample and detecting secondary or backscattered electrons. The apparatus features an electron beam generator with at least one electron gun, a movable support for the inspection sample, and a detector unit with multiple electron detecting elements. This design allows for the simultaneous processing of detection signals, enhancing the efficiency of inspections.

Career Highlights

Throughout his career, Masaki Yamabe has worked with notable companies, including Fujitsu Corporation and Fujitsu Limited. His experience in these organizations has contributed to his expertise in developing advanced inspection technologies.

Collaborations

Yamabe has collaborated with esteemed colleagues such as Ichiro Honjo and Kenji Sugishima. Their combined efforts have furthered advancements in the field of electron beam technology.

Conclusion

Masaki Yamabe's contributions to the field of electron beam technology and pattern inspection apparatuses have established him as a key figure in innovation. His patents reflect a commitment to enhancing the accuracy and efficiency of inspections in the semiconductor industry.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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